Provisioning a reference voltage based on an evaluation of a pseudo-precision resistor of an IC die
US12066959B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 12, 2022 |
| Grant date | Aug 20, 2024 |
| Priority date | — |
| Expiry date | Jun 6, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2213/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques and mechanisms for determining a reference voltage which is to be provided with an integrated circuit (IC) die. In an embodiment, the IC die comprises a resistor, and a hardware interface which accommodates coupling of the IC die to a test unit. The test unit provides functionality to perform an evaluation of a resistance of the resistor, wherein said resistance is indicative of the respective resistances of one or more other resistors of the IC die. Based on the evaluation, the test unit provides to the IC die an indication of a scale factor, wherein the reference voltage is generated based on the scale factor. In another embodiment, the IC die further comprises an amplifier circuit which receives the reference voltage, wherein a variable resistance circuit of the IC die is configured based on an output of the amplifier circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.