Method and apparatus for spot-checking visual inspection system
US12067710B2 · kind B2 · utility
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1References
20Claims
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Key dates
| Filing date | Apr 7, 2023 |
| Grant date | Aug 20, 2024 |
| Priority date | — |
| Expiry date | Apr 7, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spot-checking method for a visual inspection system includes obtaining a plurality of to-be-inspected images, inspecting the plurality of to-be-inspected images to obtain defect types and/or parameters of a target object in the plurality of to-be-inspected images, and confirming availability of the visual inspection system based on the defect types and/or the parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.