Patent · US Active

Microscale plasma limiter integrated into thick film interconnect

US12068516B2 · kind B2 · utility

0Cited by
8References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 2022
Grant dateAug 20, 2024
Priority date
Expiry dateDec 2, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01P3/003
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A radio frequency (RF) transmission line is described. The RF transmission line includes a first ground line, a second ground line, and a signal line disposed on a substrate and forming a coplanar waveguide. A plasma limiter feature is integrated into an internal surface of one or more of the first ground line, the second ground line, and the signal line. The plasma limiter decreases a gap distance between the signal line and the associated ground line. The gap distance is selected, together with a gas pressure, to control a voltage at which the gas within the gap breaks down, targeted at a breakdown power of 1 W across a wide bandwidth. The plasma limiter thus limits a power transmitted by way of the RF transmission line for protecting a sensitive integrated circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.