Apparatus, systems and methods for detecting light
US12072188B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 16, 2020 |
| Grant date | Aug 27, 2024 |
| Priority date | — |
| Expiry date | Mar 21, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2826
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus comprising: a double path interferometer comprising a sample path for an object and a reference path; a source of linearly polarized light for the double path interferometer, a phase plate positioned in the sample path; means for superposing the sample path and reference path to create a beam of light for detection; means for spatially modulating the beam of light to produce a modulated beam of light; means for dispersing the modulated beam of light to produce a spatially modulated and dispersed beam of light; a first detector; a second detector, and means for splitting the spatially modulated and dispersed beam of light, wherein light of a first linear polarization is directed to the first detector and light of a second linear polarization, orthogonal to the first linear polarization, is directed to the second detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.