Measuring jig, and calibration method and terahertz wave measuring method using same
US12072285B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 1, 2021 |
| Grant date | Aug 27, 2024 |
| Priority date | — |
| Expiry date | Jan 21, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/0307
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention is configured to include a spectroscopy cell 100 as a container including one or more spaces, each of which has a plate shape and contains a to-be-measured object that transmits or reflects a terahertz wave; and a holder 6 including one or more first holder through-holes 6b and 6c disposed at positions corresponding to the spaces of the spectroscopy cell 100, each of the spaces containing the to-be-measured object. A body portion 1 of the spectroscopy cell 100 is made of a resin material that transmits the terahertz wave, and the spectroscopy cell 100 is loaded into the holder 6 and is used. The holder 6 has a function of holding the spectroscopy cell 100, and a function of correcting one or more of a distortion, a twist, and a bending of the spectroscopy cell 100.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.