Patent · US Active

Machine learning-based selection of metrics for anomaly detection

US12073182B2 · kind B2 · utility

0Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 17, 2023
Grant dateAug 27, 2024
Priority date
Expiry dateJul 17, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L43/024
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

A plurality of metrics records, including some records indicating metrics for which anomaly analysis has been performed, is obtained. Using a training data set which includes the metrics records, a machine learning model is trained to predict an anomaly analysis relevance score for an input record which indicates a metric name. Collection of a particular metric of an application is initiated based at least in part on an anomaly analysis relevance score obtained for the particular metric using a trained version of the model.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.