Surface topography measurement systems
US12075148B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 30, 2022 |
| Grant date | Aug 27, 2024 |
| Priority date | — |
| Expiry date | Dec 22, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/30
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A topographical measurement system uses an imaging cartridge formed of a rigid optical element and a clear, elastomeric sensing surface configured to capture high-resolution topographical data from a measurement surface. The imaging cartridge may be configured as a removable cartridge for the system so that the imaging cartridge, including the rigid optical element and elastomeric sensing surface can be removed and replaced as a single, integral component that is robust/stable over multiple uses, and easily user-replaceable as frequently as necessary or desired. The cartridge may also usefully incorporate a number of light shaping and other features to support optimal illumination and image capture.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.