Devices, systems, and methods for calibrating an optical measurement device
US12078531B2 · kind B2 · utility
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37References
28Claims
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Key dates
| Filing date | Apr 26, 2022 |
| Grant date | Sep 3, 2024 |
| Priority date | — |
| Expiry date | Mar 9, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2001/444
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An illustrative calibration member made from a material that scatters light may be used to perform a calibration operation with respect to an optical measurement device having a plurality of light sources and a plurality of detectors distributed among a plurality of modules. The calibration member may form an exterior surface configured to support the optical measurement device and scatter photons of light emitted by the optical measurement device. The calibration operation may be performed based on arrival times of the scattered photons detected by the optical measurement device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.