Methods and apparatus to perform load measurements on multi-hinged devices
US12078575B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 5, 2022 |
| Grant date | Sep 3, 2024 |
| Priority date | — |
| Expiry date | May 7, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N3/34
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example hinged device flexible substrate testing system includes: a first plate comprising a first surface configured to hold stationary a first portion of a hinged device under test; a second plate comprising a second surface configured to hold a second portion of the hinged device under test, the second portion of the hinged device coupled to the first portion via a first hinge having a first folding radius; a third plate comprising a third surface configured to hold a third portion of the hinged device under test, the third portion of the hinged device coupled to the first portion via a second hinge having a second folding radius; a first cam follower coupled to the second plate; a first drive arm configured to move the first cam follower to cause the second plate to rotate about a first hinge pivot axis of the first hinge; a first actuator configured to rotate the first drive arm; a second cam follower coupled to the third plate; a second drive arm configured to move the second cam follower to cause the third plate to rotate about a second hinge pivot axis of the second hinge; a second actuator configured to rotate the second drive arm; and a load cell configured to measure …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.