Patent · US Active

Imaging system and method for material characterization of a sample

US12078727B2 · kind B2 · utility

0Cited by

4References

13Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Frank Gumbmann · Munich, DE
Benedikt Simper · Munich, DE
Gerhard Hamberger · Munich, DE
Andreas Vonloesecke · Tutzing, DE
Matthias Beer · Neubiberg, DE

Key dates

Filing date	Oct 8, 2020
Grant date	Sep 3, 2024
Priority date	—
Expiry date	May 29, 2043

Classification

Technology area (CPC H)Electricity
CPC primaryH01Q1/42
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An imaging system for material characterization of a sample is provided. Said imaging system comprises at least two imaging arrays configured to form at least one imaging array pair. In this context, the imaging system is configured to perform at least one reflection measurement with the aid of at least one imaging array. Furthermore, the imaging system is configured to perform at least one transmission measurement with the aid of the at least one imaging array pair. In addition to this, the imaging system is configured to determine material characteristics of the sample on the basis of the at least one reflection measurement and/or the at least one transmission measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.