Wiener process-based method and device for processing accelerated degradation testing data

US12079550B1 · kind B1 · utility

Assignee

• China Electronic Product Reliability and Environmental Testing Research Institute ((The fifth electronic research institute of Ministry of Industry and Information Technology) (CEPREI Laboratory)) · CN

Inventors

• Guangze PAN · 流花街道, CN
• Xiaojian Ding · Beijing, CN
• Bochen Chen · 流花街道, CN
• Dan Li · Shandong, CN
• Lijun Sun · 红钢城街道, CN
• Wenwei Liu · 流花街道, CN
• Chengju Dong · 流花街道, CN
• Guangkuo Guo · 流花街道, CN

Key dates

• Filing date: Feb 6, 2024
• Grant date: Sep 3, 2024
• Expiry date: Feb 6, 2044

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F30/20
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

A method for processing accelerated degradation test data based on Wiener process includes obtaining accelerated degradation test data of a to-be-tested product, selecting a target time conversion model from a predefined set of time conversion models based on the accelerated degradation test data, constructing a nonlinear Wiener degradation process based on the target time conversion model, determining a product reliability function of the to-be-tested product, and testing the reliabilities of the to-be-tested product based on the product reliability function to obtain product reliability test results of the to-be-tested products.