Time-of-flight depth measurement using modulation frequency adjustment
US12080008B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | May 24, 2023 |
| Grant date | Sep 3, 2024 |
| Priority date | — |
| Expiry date | May 24, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30201
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
In a method for time-of-flight (ToF) based measurement, a scene is illuminated using a ToF light source modulated at a first modulation frequency FMOD(1). While the light is modulated using FMOD(1), depths are measured to respective surface points within the scene, where the surface points are represented by a plurality of respective pixels. At least one statistical distribution parameter is computed for the depths. A second modulation frequency FMOD(2) higher than FMOD(1) is determined based on the at least one statistical distribution parameter. The depths are then re-measured using FMOD(2) to achieve a higher depth accuracy.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.