Multi-layer polysilicon stack for semiconductor devices
US12080755B2 · kind B2 · utility
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4References
16Claims
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Key dates
| Filing date | Oct 27, 2021 |
| Grant date | Sep 3, 2024 |
| Priority date | — |
| Expiry date | Jan 22, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D1/716
Abstract
In a described example, a method of forming a capacitor includes forming a doped polysilicon layer over a semiconductor substrate. The method also includes forming a dielectric layer on the doped polysilicon layer. The method also includes forming an undoped polysilicon layer on the dielectric layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.