Patent · US Active

Method for manufacturing memory and memory

US12082393B2 · kind B2 · utility

0Cited by
0References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 6, 2021
Grant dateSep 3, 2024
Priority date
Expiry dateApr 12, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/50

Abstract

A method for manufacturing a memory and a memory is provided. The method for manufacturing a memory includes: providing a substrate; stacking an electrode support structure, a protective layer and a first mask layer in sequence on the substrate; patterning the first mask layer on an array region, and etching the protective layer, the electrode support structure and the substrate by using the patterned first mask layer as a mask, to form capacitor holes penetrating the protective layer and the electrode support structure and extending into the substrate; removing the first mask layer; and forming a first electrode layer on side walls and bottom walls of the capacitor holes, a top surface of the first electrode layer being flush with a top surface of the electrode support structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.