Surveying system and auxiliary measuring instrument
US12085379B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 6, 2021 |
| Grant date | Sep 10, 2024 |
| Priority date | — |
| Expiry date | Nov 17, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C15/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method comprising: setting up a stationary surveying device at a first known positioning in a surrounding area of the object; retrieving from a memory a set of object points of an object to be surveyed and/or to be marked; surveying and/or marking from a first positioning object points of the set of object points that can be surveyed and/or can be marked from the first positioning by means of the free beam, on the basis of a target direction; ascertaining missing object points of a set of object points; relocating the surveying device to a second, unknown positioning in the surrounding area of the object; automatically determining a second positioning by the surveying device on the basis of the knowledge of the first positioning, so that the second positioning is known; surveying and/or marking missing object points by means of the free beam from the second positioning.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.