Patent · US Active

Absolute linear-in-k spectrometer

US12085445B2 · kind B2 · utility

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Key dates

Filing dateApr 3, 2020
Grant dateSep 10, 2024
Priority date
Expiry dateApr 5, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2003/1208
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A detector system for Fourier spectroscopy such as a spectral domain optical coherence tomography instrument includes a diffractive optic for diffracting the interfering light into angularly dispersed wavenumbers, a prism for reduces a nonlinear angular dispersion among the wavenumbers, and a focusing optic for converting the angularly dispersed wavenumbers from the prism into spatially distributed wavenumbers along a detector having an array of pixels. A field lens between the focusing optic and the detector has a freeform surface for more evenly distributing the wavenumbers along the array of pixels.

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