Absolute linear-in-k spectrometer
US12085445B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 3, 2020 |
| Grant date | Sep 10, 2024 |
| Priority date | — |
| Expiry date | Apr 5, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/1208
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A detector system for Fourier spectroscopy such as a spectral domain optical coherence tomography instrument includes a diffractive optic for diffracting the interfering light into angularly dispersed wavenumbers, a prism for reduces a nonlinear angular dispersion among the wavenumbers, and a focusing optic for converting the angularly dispersed wavenumbers from the prism into spatially distributed wavenumbers along a detector having an array of pixels. A field lens between the focusing optic and the detector has a freeform surface for more evenly distributing the wavenumbers along the array of pixels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.