Assessing the measurement quality of the sensor element for measuring an object temperature
US12085456B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 2, 2020 |
| Grant date | Sep 10, 2024 |
| Priority date | — |
| Expiry date | Jul 13, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/007
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure includes a sensor element for registering temperature of an object, which includes: a substrate, wherein the substrate includes a platform face, which defines a first plane; a temperature detector, which is applied on a first temperature plane on the substrate and which is embodied to register the temperature of the object, wherein the first temperature plane lies in the first plane or essentially in parallel with the first plane; at least one sensor applied on a first subregion of the substrate for determining a temperature difference within the first subregion; and a passivation, which is applied on the substrate and which covers the substrate, the temperature detector and the sensor for determining the temperature difference, as well as residing in a method for assessing measurement quality of a sensor element of the present disclosure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.