Deflectometry devices, systems and methods
US12085473B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 24, 2020 |
| Grant date | Sep 10, 2024 |
| Priority date | — |
| Expiry date | Mar 2, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/9583
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Devices, methods and systems are disclosed that enable deflectometry on a wide array of objects, including convex and freeform optical components. One example deflectometry system includes a light source with a plurality of light emitting devices to illuminate an object under test with incident light, and a detector positioned to receive a reflected or transmitted light from the object under test. The deflectometry system further includes a movable stage for holding or securing the object under test. The movable stage can move in a translational or a rotational direction to cause the object under test to translate or rotate in a plurality of steps such that the light received at the detector encompasses a portion of a full illumination space surrounding the object, and the light received at the detector from all of the plurality of steps encompasses the full illumination space that contiguously surrounds the object under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.