Device for wavefront analysis and microscopic imaging systems comprising such analysis devices
US12085510B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2020 |
| Grant date | Sep 10, 2024 |
| Priority date | — |
| Expiry date | Aug 27, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06113
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for analysing a wavefront may be connected to a fluorescence microscopy imaging system with optical sectioning, equipped with a microscope objective including a pupil in a pupil plane, the analysis device including a two-dimensional detector including a detection plane; a two-dimensional arrangement of microlenses, arranged in an analysis plane, each microlens forming, on the detection plane, when the analysis device is connected to the microscopic imaging system, an image of an object situated in a focal plane of the microscope objective, with a given analysis field; an optical relay system optically conjugating the analysis plane and the pupil plane; a field diaphragm positioned in a plane optically conjugated with the plane of detection, and defining said analysis field; a processing unit that determines, based on the set of images formed by the microlenses, a two-dimensional map of a characteristic parameter of the wavefront in said analysis plane.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.