Sample testing method and sample analyzer
US12085513B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 28, 2023 |
| Grant date | Sep 10, 2024 |
| Priority date | — |
| Expiry date | Apr 28, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/00138
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the present invention relate to a sample image photographing method and a corresponding sample image photographing apparatus. The method comprises: transporting a sample carrier to be tested to an imaging device; determining a focusing surface representation function of said current sample carrier according to a feature of a sample on said current sample carrier, the focusing surface representation function representing a relationship between horizontal position coordinates and a focusing parameter of each point to be photographed in a sample area of said current sample carrier: controlling a horizontal drive component of a driving device such that said current sample carrier moves continuously horizontally relative to the imaging device; and causing said current sample carrier to always satisfy the focusing surface representation function during the continuous horizontal motion, so that the imaging device continuously photographs an area of interest of said current sample carrier during the continuous horizontal motion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.