Patent · US Active

Systems and methods to monitor leakage current

US12085601B2 · kind B2 · utility

0Cited by

2References

20Claims

0Family size

Assignee

STMicroelectronics SA

Inventors

Romeo Letor · Mascalucia, IT
Veronica Puntorieri · Trappeto, IT

Key dates

Filing date	Jan 4, 2022
Grant date	Sep 10, 2024
Priority date	—
Expiry date	Jul 21, 2042

Classification

Technology area (CPC H)Electricity
CPC primaryH01L2924/14
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system to monitor a MOSFET, the system including a switching arrangement configured to switchably isolate a gate terminal of the MOSFET and a source terminal of the MOSFET from a gate-control voltage source and a test circuit configured to detect a change in a gate-to-source voltage of the MOSFET over a test period, the test period occurring while the gate terminal and the source terminal are isolated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.