Intersection testing in ray tracing systems using hierarchical acceleration structures with implicitly represented nodes
US12086922B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 4, 2022 |
| Grant date | Sep 10, 2024 |
| Priority date | — |
| Expiry date | Oct 7, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/21
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Ray tracing systems and methods generate a hierarchical acceleration structure to be used for intersection testing in a ray tracing system. Nodes of the hierarchical acceleration structure are determined, each representing a region in a scene, and being linked to form the hierarchical acceleration structure. Data is stored representing the hierarchical acceleration structure, including data defining the regions represented by a plurality of the nodes. At least one node is an implicitly represented node, wherein data defining a region represented by an implicitly represented node is not explicitly included as part of the stored data but can be inferred from the stored data. Intersection testing in the ray tracing system is performed in which, based on conditions in the ray tracing system, a determination is made as to whether testing of one or more rays for intersection with a region represented by a particular node of a sub-tree is to be skipped. The one or more rays are tested for intersection in accordance with the determination.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.