Inductively coupled plasma based atomic analysis systems and methods
US12087568B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2023 |
| Grant date | Sep 10, 2024 |
| Priority date | — |
| Expiry date | Aug 28, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05H2242/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Inductively coupled plasma (ICP) analyzers use an ICP torch to generate a plasma in which a sample is atomized an ionized. Analysis of the atomic ions can be performed by atomic analysis, such as mass spectrometry (MS) or atomic emission spectrometry (AES). Particle based ICP analysis includes analysis of particles such as cells, beads, or laser ablation plumes, by atomizing and ionizing particles in an ICP torch followed by atomic analysis. In mass cytometry, mass tags of particles are analyzed by mass spectrometry, such as by ICP-MS. Systems and methods of the subject application include one or more of: a demountable ICP torch holder assembly, an external ignition device; an ICP load coil comprising an annular fin, particle suspension sample introduction fluidics, and ICP analyzers thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.