Measurement based on point selection
US12093461B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 10, 2022 |
| Grant date | Sep 17, 2024 |
| Priority date | — |
| Expiry date | Feb 10, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/04815
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Various implementations disclosed herein include devices, systems, and methods that provide measurement techniques for electronic devices such as optical see-through head mounted devices. In some implementations, a line of sight technique is used to identify a 3D position of a measurement point to enable measurement of an object in a 3D environment. In some implementations, different measurement point identification techniques are automatically selected and used to identify a 3D position of a measurement point to enable measurement of an object in a 3D environment. In some implementations, a 3D position of a measurement point is identified to enable measurement of an object in a 3D environment, where the measurement point is identified by selecting from multiple candidates that are determined using different measurement point selection techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.