Wavelength debugging method of multi-channel optical module and the optical module
US12095503B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 9, 2024 |
| Grant date | Sep 17, 2024 |
| Priority date | — |
| Expiry date | Jan 9, 2044 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/07955
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A wavelength debugging method of multi-channel optical module includes: determine the initial temperature of TEC, and plot the temperature-optical power curve of each channel; obtain temperature Tup and Tdown corresponding to upper and lower limit values of the target wavelength of each channel and the left and right security boundary temperatures Tleft′ and Tright′ of each channel; compare Tup, Tdown, Tleft′, Tright′ of each channel, when the product is qualified, record the middle two values in descending order as T1 and T2, respectively; compare the size of T1 and T2 of each channel, when the product is qualified, take the maximum value of T1 of each channel as Tdown′, and take the minimum value of T2 of each channel as Tup′, the final setting temperature of TEC is calculated as T′=(Tdown′+Tup′)/2, and the corresponding wavelength for each channel at this temperature T′ is the wavelength after debugging for each channel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.