Patent · US Active

Measurement device, measurement method, and computer-readable storage medium storing a measurement program

US12098911B2 · kind B2 · utility

0Cited by
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6Claims
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Key dates

Filing dateJun 17, 2019
Grant dateSep 24, 2024
Priority date
Expiry dateMay 14, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/10028
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Values of parameters specifying conditions for obtaining 3D measurement data representing a measurement object are output as values satisfying a condition designated by a user. The technique includes setting and changing, within a predetermined range, values of parameters specifying conditions for obtaining 3D measurement data represented by 3D coordinates indicating points on a surface of the measurement object, measuring the measurement object to obtain 3D data sets representing the measurement object based on the parameter values resulting from the setting or the change, registering the 3D data sets, storing an identification result of the measurement object based on 3D data obtained through the registration in association with the parameter values, receiving, from a user, designation of a priority condition for obtaining 3D measurement data, and outputting a combination(s) of values of parameters satisfying the priority condition based on association between identification results of the measurement object and the parameter values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.