Patent · US Active

Measuring channel and process for spatially arranging a sensor component or sensor array in a measuring channel

US12098937B2 · kind B2 · utility

0Cited by

7References

25Claims

0Family size

Assignee

SAMSON AKTIENGESELLSCHAFT · DE

Inventors

Marcel Krueger · Schwineck, DE
Michael Merscher · Falkensee, DE
Gaetano Richter · Maintal, DE
Sebastian Krause · Bruchköbel, DE

Key dates

Filing date	Nov 25, 2020
Grant date	Sep 24, 2024
Priority date	—
Expiry date	Sep 30, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01N9/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In a method for spatially arranging at least one sensor array in a measuring channel, a predetermined desired geometry of the measuring channel is provided; a desired sensor-array arrangement associated with the desired geometry of the measuring channel is provided, where the sensor-array arrangement includes spatially-defined positioning parameters and orienting parameters in regard to the sensor components; an actual geometry of the measuring channel is captured; it is determined if a positioning parameter or an orienting parameter is outside of an admissible value range in relation to the actual geometry of the measuring channel, and the at least two sensor components of the sensor array are arranged in the measuring channel according to a most-current desired-sensor-array arrangement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.