FCM based chiplet test circuit

US12099086B2 · kind B2 · utility

Assignees

• NANJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS · CN
• NANTONG INSTITUTE OF NANJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS CO., LTD. · CN

Inventors

• Zhikuang Cai · 安丰镇, CN
• Jian Song · 安丰镇, CN
• Guopeng Zhou · Shanghai, CN
• Zushuai Xie · 安丰镇, CN
• Henglu Wang · 安丰镇, CN
• Binbin Xu · Xi'an, CN
• Jiafei Yao · 安丰镇, CN
• Zixuan Wang · 安丰镇, CN
• Yufeng Guo · 安丰镇, CN

Key dates

• Filing date: Oct 20, 2022
• Grant date: Sep 24, 2024
• Expiry date: Oct 20, 2042

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/28
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The present disclosure relates to the field of design for testability of super-large-scale integrated circuits, and discloses a flexible configurable module (FCM) based chiplet test circuit. The core structure of the circuit is located at an interposer. The test circuit includes FCMs, a control signal configuration module and a test state control module, where the FCM adopts a two-way skew-symmetric structure to implement data transmission in the horizontal direction and the vertical direction; the control signal configuration module is connected to control signals of all the FCMs, so as to control the data transmission directions as well as switch on and switch off states of all the FCMs; and the test state control module controls the shift and update operations of data inside the FCMs and the control signal configuration module.