Patent · US Active

Dual magnetometer calibration

US12099107B2 · kind B2 · utility

0Cited by
3References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 12, 2023
Grant dateSep 24, 2024
Priority date
Expiry dateJun 12, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/091
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Examples of systems and methods for calibrating or operating a magnetic sensor for sensor temperature or operating conditions are provided. The magnetic sensor can comprise a dual magnetometer sensor that comprises a first, low-power-consumption magnetometer (e.g., a magneto-inductive magnetometer) and a second higher-power-consumption magnetometer (e.g., a magneto-resistive magnetometer). The second magnetometer can have a lower unit-to-unit variation in temperature calibration parameters and can be used to temperature-correct readings from the first magnetometer. The magnetic sensor can dynamically switch between usage of the first magnetometer and the second magnetometer in order to provide a dynamic sample rate that can depend on conditions within the sensor or external to the sensor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.