Patent · US Active

Method for correcting a spherical aberration of a microscope, and microscope

US12099185B2 · kind B2 · utility

0Cited by

3References

14Claims

0Family size

Assignee

LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

Christian Schumann · Gießen, DE
Ronja Capellmann · Wetzlar, DE
Alexander W. Weiss · Linden, DE

Key dates

Filing date	Oct 11, 2019
Grant date	Sep 24, 2024
Priority date	—
Expiry date	Sep 12, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/02
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A method is useable for correcting a spherical aberration of a microscope having an objective and a cover slip or object carrier, the objective having a correction element for correcting the spherical aberration. The method includes: ascertaining, by the microscope, an index of refraction of an optical medium bordering the cover slip or object carrier and/or a thickness of the cover slip or object carrier along an optical axis of the objective, ascertaining the spherical aberration based on the index of refraction of the optical medium and/or the thickness of the cover slip or object carrier, and ascertaining, based on the spherical aberration, a positioning variable, by which the correction element is adjusted so that the spherical aberration is corrected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.