Image analysis method and system
US12100209B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2021 |
| Grant date | Sep 24, 2024 |
| Priority date | — |
| Expiry date | Oct 13, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V40/20
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An image analysis method, including: obtaining influencing factors of t frames of images, where the influencing factors include self-owned features of h target subjects in each of the t frames of images and relational vector features between the h target subjects in each of the t frames of images, self-owned features of each target subject include a location feature, an attribute feature, and a posture feature, and t and h are natural numbers greater than 1; and obtaining a panoramic semantic description based on the influencing factors, where the panoramic semantic description includes a description of relationships between target subjects, relationships between actions of the target subjects and the target subjects, and relationships between the actions of the target subjects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.