Three-dimensional measurement device
US12104893B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 27, 2020 |
| Grant date | Oct 1, 2024 |
| Priority date | — |
| Expiry date | Oct 5, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2527
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional measurement device measures the three-dimensional shape of an object or information indicating a shape thereof based on event data. A stripe pattern is projected from the projection unit to the object. The object is optically imaged by an imaging unit and an image based on event data is acquired. The event data, which are outputted from the image sensor, include two-dimensional point data that specifies the positions of pixels corresponding to the pixels that had luminance changes responsively to the stripe pattern projected. Based on the event data, an image of the object is obtained. The image sensor outputs positive luminance change event data when brightening luminance changes and negative luminance change event data when darkening luminance changes. The measurement unit obtains luminance information based on a time difference between output of event data of positive luminance changes and output of event data of negative luminance changes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.