Structure evaluation system, structure evaluation apparatus, and structure evaluation method
US12104986B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 3, 2022 |
| Grant date | Oct 1, 2024 |
| Priority date | — |
| Expiry date | Mar 3, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/0289
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one embodiment, a structure evaluation system includes at least three or more sensors, a position locator, and an evaluator. The three or more sensors are arranged on surfaces different from a surface to which an impact is applied with respect to a structure at different intervals in a first direction of the structure and a second direction orthogonal to the first direction and detects elastic waves generated from the structure. The position locator locates a position of a source in which the elastic waves are generated on the basis of the elastic waves detected by each of the three or more sensors. The evaluator evaluates a deterioration state of the structure on the basis of information based on a position location process of the position locator and information indicating a position where the impact is applied.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.