Photographing condition determining method for metal structure, photographing method for metal structure, phase classification method for metal structure, photographing condition determining device for metal structure, photographing device for metal structure, phase classification device for metal structure, material property estimating method for metal material, and material property estimating device for metal material
US12106466B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 8, 2021 |
| Grant date | Oct 1, 2024 |
| Priority date | — |
| Expiry date | Mar 29, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A photographing condition determining method includes: photographing a part of a metal structure of a metal material subjected to predetermined sample preparation under a predetermined photographing condition; assigning, to pixels corresponding to one or a plurality of predetermined phases of the metal structure, labels of respective phases for a photographed image; calculating one or more feature values for a pixel to which a label of one of the assigned phases; classifying the phases of the metal structure of the image by inputting a calculated feature value to a model, which has been learned in advance using feature values assigned with labels of respective phases as input and labels of the respective phases as output, and acquiring a label of a phase of a pixel corresponding to the input feature value; and determining a photographing condition when other parts of the metal structure are photographed based on a classification result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.