Method and apparatus for determining a reflectance of a target object
US12111253B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 27, 2020 |
| Grant date | Oct 8, 2024 |
| Priority date | — |
| Expiry date | Jun 24, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q50/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for determining a reflectance, of at least a portion of a target object, in at least one selected wavelength range of electromagnetic (EM) radiation are disclosed. The method comprises, for each selected wavelength range, providing a digital image including at least one target object and a plurality of reference objects, each reference object having respective non-identical predetermined reflectance characteristics, with a digital camera arrangement that provides output image data that comprises digital numbers that are responsive to radiation, in only a selected wavelength range, incident at a sensing plane of the digital camera arrangement. A relationship between a first set of the digital numbers is determined and a first set of the respective predetermined reflectance characteristics of the reference objects. Responsive to the relationship, a further set of digital numbers is transformed to allocate a value of reflectance for each of the digital numbers in the further set. For at least a portion of the target object, a corresponding first group of allocated values of reflectance is determined and responsive to the first group of allocated values, determin…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.