Testing system and testing method
US12111353B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 20, 2022 |
| Grant date | Oct 8, 2024 |
| Priority date | — |
| Expiry date | Apr 14, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L7/0331
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing system includes a signal generator circuit, a jitter modulation circuit, and an oscilloscope circuit. The signal generator circuit is configured to generate a clock pattern signal with a single clock pattern frequency. The jitter modulation circuit is configured to generate a jitter signal. A device-under-test is configured to receive an input signal. The input signal is a combination signal of the clock pattern signal and the jitter signal. The device-under-test includes a clock data recovery circuit and is further configured to generate an output signal according to the input signal. The oscilloscope circuit is configured to receive the output signal for determining performance of the clock data recovery circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.