Patent · US Active

Laser scanning microscope and method for determining a position of a fluorophore

US12111454B2 · kind B2 · utility

0Cited by

2References

15Claims

0Family size

Assignee

LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

Arnold Giske · Sandhausen, DE
Jonas Foelling · Freiburg (Elbe), DE

Key dates

Filing date	Nov 18, 2020
Grant date	Oct 8, 2024
Priority date	—
Expiry date	Jul 29, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG02B26/0875
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A laser scanning microscope includes a light source configured to emit an illumination light beam. The illumination light beam has a transverse light intensity profile comprising an intensity minimum. The laser scanning microscope further includes a scanning device configured to scan the illumination light beam along a closed trajectory in a target area of a specimen, and a detector configured to detect fluorescence light emitted by a fluorophore within the target area of the specimen. The fluorophore is excited by the illumination light beam. The laser scanning microscope further includes a processor configured to determine an intensity distribution of the fluorescence light as a function of time and to determine a position of the fluorophore within the target area based on the intensity distribution of the fluorescence light.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.