Method for predicting fluctuation of circuit path delay on basis of machine learning
US12112243B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 12, 2019 |
| Grant date | Oct 8, 2024 |
| Priority date | — |
| Expiry date | Jan 19, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N7/01
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for predicting the fluctuation of circuit path delay on the basis of machine learning, comprising the following steps: S1: selecting suitable sample characteristics by means of analyzing the relationship between circuit characteristics and path delay; S2: generating a random path by means of enumerating values of randomized parameters, acquiring the maximum path delay by means of performing Monte Carlo simulation on the random path, selecting a reliable path by means of the 3σ standard, and using the sample characteristics and path delay of the reliable path as a sample set (D); S3: establishing a path delay prediction model, and adjusting parameters of the model; S4: verifying the precision and stability of the path delay prediction model; S5: obtaining the path delay. The method for predicting the fluctuation of circuit path delay on the basis of machine learning has the advantages of high precision and low running time, thereby having remarkable advantages in the accuracy and efficiency of timing analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.