Patent · US Active

Wafer processing system

US12112958B2 · kind B2 · utility

0Cited by
2References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 28, 2023
Grant dateOct 8, 2024
Priority date
Expiry dateNov 28, 2043

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/304
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Disclosed is a wafer processing system comprising a processing tank, a cleaning device and a drying device. The processing tank has a cantilever rotating device and a dynamic balance correction device. The cantilever rotating device has a holding part for holding a wafer of a variety of specification parameters and causing the wafer to rotate along a rotating shaft of the cantilever rotating device. The dynamic balance correction device performs a corresponding dynamic balance correction on the cantilever rotating device, so that the cantilever rotating device is in a dynamic balance state during rotation. A dynamic nozzle unit of the cleaning device ejects a cleaning fluid to clean the rotating wafer. The drying device is used to dry the rotating wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.