Ring oscillator and test method
US12113535B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 10, 2022 |
| Grant date | Oct 8, 2024 |
| Priority date | — |
| Expiry date | Jan 20, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L22/34
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments provide a ring oscillator and test method. The ring oscillator includes a first logic gate, a second logic gate, and a switch circuit. The first logic gate is configured to receive a test signal. The second logic gate includes a first NAND gate and a first NOR gate connected in sequence. An output terminal of the second logic gate is connected to an input terminal of the first logic gate, and the second logic gate is configured to receive output of the first logic gate to form a loop. The switch circuit includes a first switch circuit and a second switch circuit. The first switch circuit may be configured to control on/off of a power supply terminal of the first NAND gate and a ground terminal of the first NOR gate. The second switch circuit is configured to control on/off of a ground terminal of the first NAND gate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.