Beamforming device testing
US12113583B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 7, 2021 |
| Grant date | Oct 8, 2024 |
| Priority date | — |
| Expiry date | Jan 10, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B7/0617
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Improved electrical testing of N-port beamforming devices is provided. For testing, an N:1 electrical network is connected to the N ports of the device under test to provide a single test port. This mode of testing can be used to determine parameters of interest (e.g., far field radiation patterns etc.) of the device under test more rapidly than with antenna range testing or with characterization of each port of the device under test. The N:1 electrical network can be passive or active. The N:1 electrical network can be integrated in a probe head to provide probe array testing of beamforming devices. Alternatively, the N:1 electrical network can be integrated with the device under test to provide onboard testing capability.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.