Use of clean and dry gas for particle removal and assembly therefor
US12121842B2 · kind B2 · utility
0Cited by
5References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 29, 2019 |
| Grant date | Oct 22, 2024 |
| Priority date | — |
| Expiry date | Oct 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/0612
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
The invention features particle removal assemblies and methods for removing dust and other debris from a sample container, e.g., to improve counting colonies of microorganisms (e.g., bacteria, fungi, or protists) present in environmental, pharmaceutical, biological, and other samples. An assembly of the invention includes components for particle removal, e.g., a filter, a dryer, a flow controller, and an outlet. The invention also provides methods of detecting samples after cleaning a sample container with clean and/or dry gas.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.