Methods and systems for blown film thickness measurement
US12123700B2 · kind B2 · utility
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24References
13Claims
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Key dates
| Filing date | Sep 24, 2020 |
| Grant date | Oct 22, 2024 |
| Priority date | — |
| Expiry date | Sep 5, 2041 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB29C2948/92647
- WIPO fieldOther special machines
- WIPO sectorMechanical engineering
Abstract
Methods and systems of measurement for blown film lines are provided. The sensing system includes a terahertz (THz) sensor positioned adjacent to a film bubble extruded from a blown film die, and a sensor support configured to guide the THz sensor around the circumference of the film bubble to measure its film thickness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.