Temperature measurement circuit, temperature and light intensity measurement circuit, temperature measurement method and temperature and light intensity measurement method
US12123788B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Oct 11, 2021 |
| Grant date | Oct 22, 2024 |
| Priority date | — |
| Expiry date | Feb 4, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03F2203/45528
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to the field of biometric parameter measurement, and in particular, to a temperature measurement circuit, a temperature measurement method, a temperature and light intensity measurement circuit, a temperature and light intensity measurement method, a chip, a module, and an electronic device. A temperature signal is obtained based on an output voltage of a differential amplifier circuit when a non-inverting input terminal of the differential amplifier circuit is unload, an output voltage of the differential amplifier circuit when the non-inverting input terminal of the differential amplifier circuit is connected to a calibration resistor, and the output voltage of the differential amplifier circuit when the non-inverting input terminal of the differential amplifier circuit is connected to a thermistor, which improves the accuracy of the temperature measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.