Method and apparatus for processing accelerated test data based on multiple performance degradation, and computer device

US12124248B1 · kind B1 · utility

Assignee

• China Electronic Product Reliability And Environmental Testing Research Institute · CN

Inventors

• Guangze PAN · 流花街道, CN
• Dan Li · Shandong, CN
• Bochen Chen · 流花街道, CN
• Lijun Sun · 红钢城街道, CN
• Yuanhang Wang · 流花街道, CN
• Wenwei Liu · 流花街道, CN
• Jianfeng Yang · San Jose, US
• Xiaojian Ding · Beijing, CN

Key dates

• Filing date: Apr 3, 2024
• Grant date: Oct 22, 2024
• Expiry date: Apr 3, 2044

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y02P90/30
• WIPO field: Control
• WIPO sector: Instruments

Abstract

The present disclosure relates to a method and an apparatus for processing accelerated test data based on multiple performance degradation, and a device. The method includes: a computer device obtaining multiple performance parameter values of a target product, and determining an association relationship among the performance parameter values, the association relationship including an independent coexistence relationship and a backup relationship, and the performance parameter values being obtained by applying an acceleration stress to the target product in an acceleration experiment; the computer device determining a reliability estimation model corresponding to the association relationship based on the association relationship, and according to the reliability estimation model and each performance parameter value, obtaining a reliability function of multiple performance degradation corresponding to the target product; the computer device obtaining, according to the reliability function of multiple performance degradation, a product reliability estimation index corresponding to the target product under normal stress.