Similar-defect search/display system, apparatus and method
US12124503B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2021 |
| Grant date | Oct 22, 2024 |
| Priority date | — |
| Expiry date | Jul 1, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to one embodiment, system includes a determination unit, a first storage, a second storage, a search unit and a display. The determination unit determines a feature quantity of the process-targeted manufacturing data. The first storage stores cause-unidentified manufacturing data. The second storage stores cause-identified manufacturing data. The search unit searches, based on the feature quantity of the process-targeted manufacturing data, the first storage and the second storage for the cause-unidentified manufacturing data and the cause-identified manufacturing data that have a feature quantity similar to that of the process-targeted manufacturing data. The display displays the search result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.