Patent · US Active

Modeling method

US12124786B2 · kind B2 · utility

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10Claims
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Key dates

Filing dateAug 16, 2021
Grant dateOct 22, 2024
Priority date
Expiry dateAug 4, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B43/27
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A modeling method of shape-approximating a shape measurement target provided in a structure having a stack structure by a boundary line, and a standard deviation is provided as a tolerance for a measurement value of the shape measurement target, and a calculation boundary line is arranged to converge within the tolerance, and thereby, a shape of the shape measurement target is expressed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.