Dynamic analysis and monitoring of machine learning processes
US12124925B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 6, 2020 |
| Grant date | Oct 22, 2024 |
| Priority date | — |
| Expiry date | May 10, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q40/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The disclosed embodiments include computer-implemented processes that flexibly and dynamically analyze a machine learning process, and that generate analytical output characterizing an operation of the machine learning process across multiple analytical periods. For example, an apparatus may receive an identifier of a dataset associated with the machine learning process and feature data that specifies an input feature of the machine learning process. The apparatus may access at least a portion of the dataset based on the received identifier, and obtain, from the accessed portion of the dataset, a feature vector associated with the machine learning process. The apparatus may generate a plurality of modified feature vectors based on the obtained feature vector, and based on an application of the machine learning process to the obtained and modified feature vectors, generate and transmit, to a device, first explainability data associated with the specified input feature for presentation within a digital interface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.