Patent · US Active

Electron microscopy grid

US12125668B2 · kind B2 · utility

1Cited by
1References
16Claims
0Family size

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Key dates

Filing dateFeb 25, 2020
Grant dateOct 22, 2024
Priority date
Expiry dateMay 3, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/2802
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An electron microscopy grid, includes: (i) a perforated substrate, (ii) a support film on the perforated substrate, the support film having a thickness of 60 Å or less, and (iii) linkers attached on top of the support film. The linkers has at least one affinity group for immobilizing an analyte; wherein the linkers form a non-random pattern on the support film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.