Feature extraction, labelling, and object feature map
US12130888B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 5, 2021 |
| Grant date | Oct 29, 2024 |
| Priority date | — |
| Expiry date | Sep 5, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/07
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Devices, systems, and methods for machine learning model generation. A method can include generating image chips of an image. The image chips can each provide a view of a different extent of an object in the image. Based on an object definition that indicates respective features of the object and a location of the respective features along a length of the object, it can be determined whether any of the image chips include any of the respective features. Each image chip of the image chips can be labeled to include an indication of any of the features included in the image chip resulting in labelled image chips. The method can include training an ensemble classifier based on the labelled image chips resulting in a trained ensemble classifier.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.